Characterization of Ge 2Sb 2Te 5 thin film alloys using conductive-tip atomic force microscopy

C.M. Chang; Y.J. Liu; M.L. Tseng; N.-N. Chu; D.-W. Huang; M. Mansuripur; Din-ping Tsai

doi:10.1002/pssb.201200356

Characterization of Ge 2Sb 2Te 5 thin film alloys using conductive-tip atomic force microscopy

C.M. Chang
, Y.J. Liu
, M.L. Tseng
, N.-N. Chu
, D.-W. Huang
, M. Mansuripur
, Din-ping Tsai

Research output: Journal article publication › Journal article › Academic research › peer-review

4 Citations (Scopus)

Abstract

Conductive-tip atomic force microscopy (C-AFM) is a powerful tool for investigating the electrical characteristics of phase-change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge 2Sb 2Te 5 film. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Original language	English
Pages (from-to)	1945-1950
Number of pages	6
Journal	Physica Status Solidi (B) Basic Research
Volume	249
Issue number	10
DOIs	https://doi.org/10.1002/pssb.201200356
Publication status	Published - 1 Oct 2012
Externally published	Yes

Keywords

Electronic data storage
Materials and process characterization
Optical recording
Phase-change materials

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

More information

10.1002/pssb.201200356

Cite this

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abstract = "Conductive-tip atomic force microscopy (C-AFM) is a powerful tool for investigating the electrical characteristics of phase-change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge 2Sb 2Te 5 film. {\textcopyright} 2012 WILEY-VCH Verlag GmbH \& Co. KGaA, Weinheim.",

keywords = "Electronic data storage, Materials and process characterization, Optical recording, Phase-change materials",

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AU - Chang, C.M.

AU - Liu, Y.J.

AU - Tseng, M.L.

AU - Chu, N.-N.

AU - Huang, D.-W.

AU - Mansuripur, M.

AU - Tsai, Din-ping

PY - 2012/10/1

Y1 - 2012/10/1

N2 - Conductive-tip atomic force microscopy (C-AFM) is a powerful tool for investigating the electrical characteristics of phase-change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge 2Sb 2Te 5 film. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

AB - Conductive-tip atomic force microscopy (C-AFM) is a powerful tool for investigating the electrical characteristics of phase-change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge 2Sb 2Te 5 film. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

KW - Electronic data storage

KW - Materials and process characterization

KW - Optical recording

KW - Phase-change materials

UR - https://www.scopus.com/pages/publications/84867225481

U2 - 10.1002/pssb.201200356

DO - 10.1002/pssb.201200356

M3 - Journal article

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JO - Physica Status Solidi (B) Basic Research

JF - Physica Status Solidi (B) Basic Research

IS - 10

ER -

Characterization of Ge 2Sb 2Te 5 thin film alloys using conductive-tip atomic force microscopy

Abstract

Keywords

ASJC Scopus subject areas

More information

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