Conductive-tip atomic force microscopy (C-AFM) is a powerful tool for investigating the electrical characteristics of phase-change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge 2Sb 2Te 5 film. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
- Electronic data storage
- Materials and process characterization
- Optical recording
- Phase-change materials
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics