TY - GEN
T1 - Characteristics of plasmonic resonance in a sandwiched metamaterial nano film
AU - Chiu, K. P.
AU - Tsai, D. P.
PY - 2006/12/1
Y1 - 2006/12/1
N2 - We will investigate the surface plasmon (SP) resonances of a dielectric-sandwiched metamaterial film. The parameters of the metamaterial are chose so that it has both negative s and μ in visible frequency range. We use transfer matrix method to calculate the attenuated total reflection (ATR) spectra of the layered system to investigate the variations of SP resonance and the associated resonance strength. The results show that for both p- and s-polarized incident lights, the plasmonic resonance can be manipulated by changing the thickness of the metamaterial. Otherwise, the plasmonic resonance strength for each SP mode can be tuned to become a maximum with proper slab thickness and light frequency for both polarized light.
AB - We will investigate the surface plasmon (SP) resonances of a dielectric-sandwiched metamaterial film. The parameters of the metamaterial are chose so that it has both negative s and μ in visible frequency range. We use transfer matrix method to calculate the attenuated total reflection (ATR) spectra of the layered system to investigate the variations of SP resonance and the associated resonance strength. The results show that for both p- and s-polarized incident lights, the plasmonic resonance can be manipulated by changing the thickness of the metamaterial. Otherwise, the plasmonic resonance strength for each SP mode can be tuned to become a maximum with proper slab thickness and light frequency for both polarized light.
UR - http://www.scopus.com/inward/record.url?scp=42649124612&partnerID=8YFLogxK
U2 - 10.1109/NUSOD.2006.306737
DO - 10.1109/NUSOD.2006.306737
M3 - Conference article published in proceeding or book
AN - SCOPUS:42649124612
SN - 078039755X
SN - 9780780397552
T3 - 2006 International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices, NUSOD '06
SP - 53
EP - 54
BT - 2006 International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices, NUSOD '06
T2 - 2006 International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices, NUSOD '06
Y2 - 11 September 2006 through 14 September 2006
ER -