Abstract
The problems of instrumental variation and sensor drift are receiving increasing concerns in the field of electronic noses. Because the two problems can be uniformly viewed as a variation of the data distribution in the feature space, they can be handled by algorithms such as transfer learning. In this paper, we propose a novel algorithm framework called transfer sample-based coupled task learning (TCTL). It is based on transfer learning and multi-task learning. Given labeled samples in the source domain (i.e. from the master device or without drift) and a small set of transfer samples as inputs, TCTL simultaneously learns a prediction model for data in the source domain and one for data in the target domain (i.e. from the slave device or with drift). The transfer samples are incorporated into a regularization term of the objective function. TCTL is an extensible framework that can apply to various classification and regression models. When combined with the standardization error-based model improvement (SEMI) strategy, its accuracy can be further enhanced. Experiments on a multi-device dataset and a popular long-term drift dataset show that the proposed algorithms achieve better accuracy compared with typical existing methods with much fewer auxiliary samples needed, which proves their efficacy and usability in real-life applications.
| Original language | English |
|---|---|
| Pages (from-to) | 288-297 |
| Number of pages | 10 |
| Journal | Sensors and Actuators, B: Chemical |
| Volume | 225 |
| DOIs | |
| Publication status | Published - 31 Mar 2016 |
Keywords
- Calibration transfer
- Drift
- Electronic nose
- Multi-task learning
- Transfer learning
- Transfer sample
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Instrumentation
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Metals and Alloys
- Electrical and Electronic Engineering
- Materials Chemistry
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