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Blind Image Super-resolution with Elaborate Degradation Modeling on Noise and Kernel

  • Zongsheng Yue
  • , Qian Zhao
  • , Jianwen Xie
  • , Lei Zhang
  • , Deyu Meng
  • , Kwan Yee K. Wong

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

Abstract

While researches on model-based blind single image super-resolution (SISR) have achieved tremendous successes recently, most of them do not consider the image degradation sufficiently. Firstly, they always assume image noise obeys an independent and identically distributed (i.i.d.) Gaussian or Laplacian distribution, which largely underestimates the complexity of real noise. Secondly, previous commonly-used kernel priors (e.g., normalization, sparsity) are not effective enough to guarantee a rational kernel solution, and thus degenerates the performance of subsequent SISR task. To address the above issues, this paper proposes a model-based blind SISR method under the probabilistic framework, which elaborately models image degradation from the perspectives of noise and blur kernel. Specifically, instead of the traditional i.i.d. noise assumption, a patch-based non-i.i.d. noise model is proposed to tackle the complicated real noise, expecting to increase the degrees of freedom of the model for noise representation. As for the blur kernel, we novelly construct a concise yet effective kernel generator, and plug it into the proposed blind SISR method as an explicit kernel prior (EKP). To solve the proposed model, a theoretically grounded Monte Carlo EM algorithm is specifically designed. Comprehensive experiments demonstrate the superiority of our method over current state-of-the-arts on synthetic and real datasets. The source code is available at https://github.com/zsyOAOA/BSRDM.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
PublisherIEEE Computer Society
Pages2118-2128
Number of pages11
ISBN (Electronic)9781665469463
DOIs
Publication statusPublished - Jun 2022
Event2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022 - New Orleans, United States
Duration: 19 Jun 202224 Jun 2022

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Volume2022-June
ISSN (Print)1063-6919

Conference

Conference2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
Country/TerritoryUnited States
CityNew Orleans
Period19/06/2224/06/22

Keywords

  • Low-level vision
  • Machine learning

ASJC Scopus subject areas

  • Software
  • Computer Vision and Pattern Recognition

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