TY - JOUR
T1 - Bayesian based lifetime prediction for high-power white LEDs
AU - Ibrahim, Mesfin Seid
AU - Jing, Zhou
AU - Yung, Kam Chuen
AU - Fan, Jiajie
N1 - Funding Information:
The work described in this paper was partially supported by the National Natural Science Foundation of China (Grant No. 51805147, 61673037) and partially supported by a grant from the Research Committee of The Hong Kong Polytechnic University under student account code RK21.
Publisher Copyright:
© 2021 Elsevier Ltd
PY - 2021/12/15
Y1 - 2021/12/15
N2 - The introduction of high-power white LEDs has revolutionized the lighting industry in the past few decades due to the multiple benefits in terms of high reliability, environmental friendliness and versatile applications. However, challenges have arisen in assessing the reliability and lifetime prediction because it is difficult to record the failure data in a short period of time. Currently, the nonlinear least squares (NLS) regression-based method is used in industry for projecting the lumen maintenance lifetime from degradation data. The model parameters estimated using the NLS regression approach are deterministic and introduce high prediction errors. In this paper, a Bayesian method is proposed to estimate the remaining useful lifetimes (RULs) of both high-power white LED packages and lamps. The accelerated degradation tests conducted for gathering lumen degradation data are used to validate the proposed method. The exponential decay model is used as the degradation model and the parameters are estimated based on Markov Chain Monte Carlo (MCMC) sampling and using the Metropolis-Hasting (MH) algorithm. The lifetime prediction results showed that the Bayesian method has better prediction accuracy compared to the NLS method. Thus, the proposed Bayesian method is shown to be a promising approach to address the lifetime prediction issue for high-power white LEDs with improved prediction accuracy.
AB - The introduction of high-power white LEDs has revolutionized the lighting industry in the past few decades due to the multiple benefits in terms of high reliability, environmental friendliness and versatile applications. However, challenges have arisen in assessing the reliability and lifetime prediction because it is difficult to record the failure data in a short period of time. Currently, the nonlinear least squares (NLS) regression-based method is used in industry for projecting the lumen maintenance lifetime from degradation data. The model parameters estimated using the NLS regression approach are deterministic and introduce high prediction errors. In this paper, a Bayesian method is proposed to estimate the remaining useful lifetimes (RULs) of both high-power white LED packages and lamps. The accelerated degradation tests conducted for gathering lumen degradation data are used to validate the proposed method. The exponential decay model is used as the degradation model and the parameters are estimated based on Markov Chain Monte Carlo (MCMC) sampling and using the Metropolis-Hasting (MH) algorithm. The lifetime prediction results showed that the Bayesian method has better prediction accuracy compared to the NLS method. Thus, the proposed Bayesian method is shown to be a promising approach to address the lifetime prediction issue for high-power white LEDs with improved prediction accuracy.
KW - Bayesian methods (BM)
KW - Lifetime prediction
KW - Light-emitting diodes (LED)
KW - Metropolis Hasting (MH)
KW - Monte Carlo Markov Chain (MCMC)
UR - https://www.sciencedirect.com/science/article/pii/S0957417421010216
UR - http://www.scopus.com/inward/record.url?scp=85111331080&partnerID=8YFLogxK
U2 - 10.1016/j.eswa.2021.115627
DO - 10.1016/j.eswa.2021.115627
M3 - Journal article
SN - 0957-4174
VL - 185
JO - Expert Systems with Applications
JF - Expert Systems with Applications
M1 - 115627
ER -