Abstract
Barium strontium zirconate titanate [(Ba 1-x Sr x )(Zr x Ti 1-x )O 3 , BSZT-100x], thin films with x = 0.025 and 0.05 (BSZT-2.5 and BSZT-5) were grown on MgO (100) substrates by pulsed laser deposition. X-ray diffraction measurements revealed that the BSZT films had grown epitaxially on the MgO (100) substrates. The refractive index and thickness of the BSZT-2.5 and BSZT-5 films were determined using a prism coupler. The electro-optic (E-O) properties were measured at 632.8 nm wavelength using a phase modulation detection method. The BSZT films exhibited a predominantly quadratic E-O behavior and the E-O coefficient of BSZT-2.5 and BSZT-5 were found to be 1.52 × 10 -18 m 2 /V 2 and 2.04 × 10 -18 m 2 /V 2 , respectively.
| Original language | English |
|---|---|
| Pages (from-to) | 107-114 |
| Number of pages | 8 |
| Journal | Integrated Ferroelectrics |
| Volume | 80 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1 Nov 2006 |
Keywords
- BSZT thin films
- Coefficient
- Electro-optic
- Prism coupler
- Pulsed laser deposition
ASJC Scopus subject areas
- Control and Systems Engineering
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Condensed Matter Physics
- Materials Chemistry
- Electrical and Electronic Engineering