Barium Strontium Zirconate Titanate (BSZT) thin films for optical waveguide applications

S. H. Choy, D. Y. Wang, J. Y. Dai, H. L.W. Chan, C. L. Choy

Research output: Journal article publicationJournal articleAcademic researchpeer-review

1 Citation (Scopus)

Abstract

Barium strontium zirconate titanate [(Ba 1-x Sr x )(Zr x Ti 1-x )O 3 , BSZT-100x], thin films with x = 0.025 and 0.05 (BSZT-2.5 and BSZT-5) were grown on MgO (100) substrates by pulsed laser deposition. X-ray diffraction measurements revealed that the BSZT films had grown epitaxially on the MgO (100) substrates. The refractive index and thickness of the BSZT-2.5 and BSZT-5 films were determined using a prism coupler. The electro-optic (E-O) properties were measured at 632.8 nm wavelength using a phase modulation detection method. The BSZT films exhibited a predominantly quadratic E-O behavior and the E-O coefficient of BSZT-2.5 and BSZT-5 were found to be 1.52 × 10 -18 m 2 /V 2 and 2.04 × 10 -18 m 2 /V 2 , respectively.
Original languageEnglish
Pages (from-to)107-114
Number of pages8
JournalIntegrated Ferroelectrics
Volume80
Issue number1
DOIs
Publication statusPublished - 1 Nov 2006

Keywords

  • BSZT thin films
  • Coefficient
  • Electro-optic
  • Prism coupler
  • Pulsed laser deposition

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry
  • Electrical and Electronic Engineering

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