Barium Strontium Zirconate Titanate (BSZT) thin films for optical waveguide applications

S. H. Choy; D. Y. Wang; J. Y. Dai; H. L.W. Chan; C. L. Choy

doi:10.1080/10584580600656601

Barium Strontium Zirconate Titanate (BSZT) thin films for optical waveguide applications

S. H. Choy, D. Y. Wang, J. Y. Dai, H. L.W. Chan, C. L. Choy

The Hong Kong Polytechnic University

Research output: Journal article publication › Journal article › Academic research › peer-review

2 Citations (Scopus)

Abstract

Barium strontium zirconate titanate [(Ba 1-x Sr x )(Zr x Ti 1-x )O 3 , BSZT-100x], thin films with x = 0.025 and 0.05 (BSZT-2.5 and BSZT-5) were grown on MgO (100) substrates by pulsed laser deposition. X-ray diffraction measurements revealed that the BSZT films had grown epitaxially on the MgO (100) substrates. The refractive index and thickness of the BSZT-2.5 and BSZT-5 films were determined using a prism coupler. The electro-optic (E-O) properties were measured at 632.8 nm wavelength using a phase modulation detection method. The BSZT films exhibited a predominantly quadratic E-O behavior and the E-O coefficient of BSZT-2.5 and BSZT-5 were found to be 1.52 × 10 -18 m 2 /V 2 and 2.04 × 10 -18 m 2 /V 2 , respectively.

Original language	English
Pages (from-to)	107-114
Number of pages	8
Journal	Integrated Ferroelectrics
Volume	80
Issue number	1
DOIs	https://doi.org/10.1080/10584580600656601
Publication status	Published - 1 Nov 2006

Keywords

BSZT thin films
Coefficient
Electro-optic
Prism coupler
Pulsed laser deposition

ASJC Scopus subject areas

Control and Systems Engineering
Electronic, Optical and Magnetic Materials
Ceramics and Composites
Condensed Matter Physics
Materials Chemistry
Electrical and Electronic Engineering

More information

10.1080/10584580600656601

Cite this

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title = "Barium Strontium Zirconate Titanate (BSZT) thin films for optical waveguide applications",

abstract = "Barium strontium zirconate titanate [(Ba 1-x Sr x )(Zr x Ti 1-x )O 3 , BSZT-100x], thin films with x = 0.025 and 0.05 (BSZT-2.5 and BSZT-5) were grown on MgO (100) substrates by pulsed laser deposition. X-ray diffraction measurements revealed that the BSZT films had grown epitaxially on the MgO (100) substrates. The refractive index and thickness of the BSZT-2.5 and BSZT-5 films were determined using a prism coupler. The electro-optic (E-O) properties were measured at 632.8 nm wavelength using a phase modulation detection method. The BSZT films exhibited a predominantly quadratic E-O behavior and the E-O coefficient of BSZT-2.5 and BSZT-5 were found to be 1.52 × 10 -18 m 2 /V 2 and 2.04 × 10 -18 m 2 /V 2 , respectively.",

keywords = "BSZT thin films, Coefficient, Electro-optic, Prism coupler, Pulsed laser deposition",

author = "Choy, {S. H.} and Wang, {D. Y.} and Dai, {J. Y.} and Chan, {H. L.W.} and Choy, {C. L.}",

year = "2006",

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day = "1",

doi = "10.1080/10584580600656601",

language = "English",

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T1 - Barium Strontium Zirconate Titanate (BSZT) thin films for optical waveguide applications

AU - Choy, S. H.

AU - Wang, D. Y.

AU - Dai, J. Y.

AU - Chan, H. L.W.

AU - Choy, C. L.

PY - 2006/11/1

Y1 - 2006/11/1

N2 - Barium strontium zirconate titanate [(Ba 1-x Sr x )(Zr x Ti 1-x )O 3 , BSZT-100x], thin films with x = 0.025 and 0.05 (BSZT-2.5 and BSZT-5) were grown on MgO (100) substrates by pulsed laser deposition. X-ray diffraction measurements revealed that the BSZT films had grown epitaxially on the MgO (100) substrates. The refractive index and thickness of the BSZT-2.5 and BSZT-5 films were determined using a prism coupler. The electro-optic (E-O) properties were measured at 632.8 nm wavelength using a phase modulation detection method. The BSZT films exhibited a predominantly quadratic E-O behavior and the E-O coefficient of BSZT-2.5 and BSZT-5 were found to be 1.52 × 10 -18 m 2 /V 2 and 2.04 × 10 -18 m 2 /V 2 , respectively.

AB - Barium strontium zirconate titanate [(Ba 1-x Sr x )(Zr x Ti 1-x )O 3 , BSZT-100x], thin films with x = 0.025 and 0.05 (BSZT-2.5 and BSZT-5) were grown on MgO (100) substrates by pulsed laser deposition. X-ray diffraction measurements revealed that the BSZT films had grown epitaxially on the MgO (100) substrates. The refractive index and thickness of the BSZT-2.5 and BSZT-5 films were determined using a prism coupler. The electro-optic (E-O) properties were measured at 632.8 nm wavelength using a phase modulation detection method. The BSZT films exhibited a predominantly quadratic E-O behavior and the E-O coefficient of BSZT-2.5 and BSZT-5 were found to be 1.52 × 10 -18 m 2 /V 2 and 2.04 × 10 -18 m 2 /V 2 , respectively.

KW - BSZT thin films

KW - Coefficient

KW - Electro-optic

KW - Prism coupler

KW - Pulsed laser deposition

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DO - 10.1080/10584580600656601

M3 - Journal article

SN - 1058-4587

VL - 80

SP - 107

EP - 114

JO - Integrated Ferroelectrics

JF - Integrated Ferroelectrics

IS - 1

ER -

Barium Strontium Zirconate Titanate (BSZT) thin films for optical waveguide applications

Abstract

Keywords

ASJC Scopus subject areas

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