Automatic detection of surface defects based on deep random chains
- Tan Zhang
- , Zihe Wang
- , Fengwei Li
- , Haoyang Zhong
- , Xuejuan Hu
- , Wenjun Zhang
- , Dan Zhang
- , Xiaoxu Liu
Research output: Journal article publication › Journal article › Academic research › peer-review
26
Link opens in a new tab
Citations
(Scopus)