Asymmetric Band Alignments and Remark Defect Tolerability at the Interface of High-k Dielectric Sb2O3 and 2D Semiconductor MoS2

Ming Yang, Shijie Wang, Tingting Song, Yulin Yang, Jun Zhou, Tong Yang, Ming Gang Zeng, Jingyu He, Qin Liu, Yang ZUO

Research output: Journal article publicationJournal articleAcademic researchpeer-review

Abstract

Inorganic molecule crystal Sb 2O 3 has been identified as a promising high-k dielectric for direct integration with the two-dimensional (2D) semiconductor MoS 2. However, a comprehensive understanding of their interface remains elusive, impeding their applications in high-performance 2D electronics. In this study, we elucidate the interfacial interaction, and electronic and defect properties of the Sb 2O 3/monolayer MoS 2 interface using in-depth first-principles calculations. We find that a high-performance quasi-van der Waals interface can be formed between Sb 2O 3 and monolayer MoS 2, as evidenced by weak interfacial interaction, a dangling-bond-free interface, insignificant electron-hole puddle redistribution, and the preserved semiconducting properties of monolayer MoS 2. Notably, the interface exhibits a remarkable defect tolerance capability during integration, as Sb 2O 3 cluster vacancies (the dominant defect in Sb 2O 3) neither introduce midgap states nor significantly affect the interface properties. Besides, our study reveals a strongly asymmetric type-I band alignment at the interface, where the conduction and valence band offsets are predicted to be 1.07 and 0.25 eV at the PBE level, respectively. Our work offers a comprehensive understanding of the quasi-vdW interface between Sb 2O 3 and monolayer MoS 2, which could be useful for the development of inorganic molecular crystals as high-k dielectrics for high-performance 2D electronic devices.

Original languageEnglish
Pages (from-to)10627-10633
Number of pages7
JournalJournal of Physical Chemistry C
Volume128
Issue number25
DOIs
Publication statusPublished - 13 Jun 2024

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