Abstract
High power white LED (HPWLED) with the benefits of high efficiency, small size, lower power consumption and high reliability has been commercially used as a substitute of the traditional white light sources in the application of general lighting systems, monitor backlighting and so on. Nowadays, in the LED's reliability field, many previous researches paid attentions only on the lumen depreciation failure in LED products, ignoring another common failure mode called chromaticity shift. In this paper, we used a data-driven method based on a multivariate distance measure, Mahalanobis distance (MD), to detect the chromaticity shift anomaly of HPWLED after aging test. The result shows that by dealing MD distributions with Weibull statistical model, a chromaticity anomaly alarm indicator can be established to detect anomaly of chromaticity shift before HPWLED failed.
Original language | English |
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Title of host publication | 14th International Conference on Electronic Materials and Packaging, EMAP 2012 |
DOIs | |
Publication status | Published - 1 Dec 2012 |
Event | 14th International Conference on Electronic Materials and Packaging, EMAP 2012 - Lantau Island, Hong Kong Duration: 13 Dec 2012 → 16 Dec 2012 |
Conference
Conference | 14th International Conference on Electronic Materials and Packaging, EMAP 2012 |
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Country/Territory | Hong Kong |
City | Lantau Island |
Period | 13/12/12 → 16/12/12 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials