Abstract
KGaA, Weinheim This work proposes a method for extracting the barrier height, ideality factor, series, and shunt resistances of Schottky diodes with high accuracy and consistency. By defining the voltage boundaries for the three regions of the current–voltage curve that are controlled by shunt resistance, thermal emission, and series resistance, respectively, the method can avoid the problems of traditional methods through nonlinear fitting and iterations. The application on Schottky-diode-type hydrogen sensor with a structure of Pd/WO3/SiC reveals excellent agreement between the extracted voltage boundaries and the turning points on the current–voltage curve under different temperatures and hydrogen concentrations. The average mean-squared error of the model current–voltage data vs. experimental data is 0.371, more than five times smaller than that of traditional methods based on least-squares linear regression.
Original language | English |
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Pages (from-to) | 2764-2768 |
Number of pages | 5 |
Journal | Physica Status Solidi (A) Applications and Materials Science |
Volume | 213 |
Issue number | 10 |
DOIs | |
Publication status | Published - 1 Oct 2016 |
Keywords
- hydrogen sensor
- modeling
- Pd/WO /SiC 3
- resistance
- Schottky diode
- silicon carbide
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering
- Materials Chemistry