An optimization model for reuse scenario selection considering reliability and cost in software product line development

Zhiqiao Wu, Jiafu Tang, Chun Kit Kwong, Ching Yuen Chan

Research output: Journal article publicationJournal articleAcademic researchpeer-review

12 Citations (Scopus)

Abstract

In this paper, a model that assists developers to evaluate and compare alternative reuse scenarios in software product line (SPL) development systematically in proposed. The model can identify basic activities (abstracted as operations) and precisely relate cost and reliability with each basic operation. A typical reuse mode is described from the perspectives of application and domain engineering. According to this scheme, six reuse modes are identified, and alternative industry reuse scenarios can be derived from these modes. A bi-objective 0-1 integer programming model is developed to help decision makers select reuse scenarios when they develop a SPL to minimize cost and maximize reliability while satisfying system requirements to a certain degree. This model is called the cost and reliability optimization under constraint satisfaction (CROS). To design the model efficiently, a three-phase algorithm for finding all efficient solutions is developed, where the first two phases can obtain an efficient solution, and the last phase can generate a nonsupported efficient solution. Two practical methods are presented to facilitate decision making on selecting from the entire range of efficient solutions in light of the decision-maker's preference for mancomputer interaction. An application of the CROS model in a mail server system development is presented as a case study.
Original languageEnglish
Pages (from-to)811-841
Number of pages31
JournalInternational Journal of Information Technology and Decision Making
Volume10
Issue number5
DOIs
Publication statusPublished - 1 Sept 2011

Keywords

  • efficient solution
  • optimization models
  • reuse models
  • Software product line

ASJC Scopus subject areas

  • Computer Science (miscellaneous)

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