An intelligent model for detecting and classifying color-textured fabric defects using genetic algorithms and the Elman neural network

Yh Zhang, Cwm Yuen, Wk Wong, Chi Wai Kan

Research output: Journal article publicationJournal articleAcademic researchpeer-review

21 Citations (Scopus)

Abstract

In this paper, an intelligent color-textured fabric defect detection and classification model using genetic algorithms and the Elman neural network is introduced. A color ring projection is used for image processing, and the solution for optimization of parameters is based on the genetic algorithm method. The new modified Elman network is proposed to classify the type of fabric defects, which have proportional, integral, and derivative properties. The proposed inspecting model in this study is more feasible and applicable in fabric and stitching garment defect detection and classification.
Original languageEnglish
Pages (from-to)1772-1787
Number of pages16
JournalTextile Research Journal
Volume81
Issue number17
DOIs
Publication statusPublished - 1 Jan 2011

Keywords

  • color ring-projection classification
  • Elman neural network
  • fabric defect detection
  • genetic algorithm

ASJC Scopus subject areas

  • Chemical Engineering (miscellaneous)
  • Polymers and Plastics

Cite this