An intelligent knitted garment defect detection and classification model based on gabor filter and modified Elman neural network

Y. H. Zhang, C. W.M. Yuen, Wai Keung Wong, Chi Wai Kan

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

3 Citations (Scopus)

Fingerprint

Dive into the research topics of 'An intelligent knitted garment defect detection and classification model based on gabor filter and modified Elman neural network'. Together they form a unique fingerprint.

Keyphrases

Engineering

Mathematics