An intelligent knitted garment defect detection and classification model based on gabor filter and modified elman neural network

Y.H. Zhang; C.W.M. Yuen; Wai Keung Wong; Chi Wai Kan

An intelligent knitted garment defect detection and classification model based on gabor filter and modified elman neural network

Y.H. Zhang, C.W.M. Yuen, Wai Keung Wong, Chi Wai Kan

The Hong Kong Polytechnic University

Research output: Unpublished conference presentation (presented paper, abstract, poster) › Conference presentation (not published in journal/proceeding/book) › Academic research › peer-review

Original language	English
Pages	69-74
Number of pages	6
Publication status	Published - 2010
Event	International Conference on Image Analysis and Signal Processing [IASP] - Duration: 1 Jan 2010 → …

Conference

Conference	International Conference on Image Analysis and Signal Processing [IASP]
Period	1/01/10 → …

Cite this

@conference{226595c2a314487a8cc74ae5736cee55,

title = "An intelligent knitted garment defect detection and classification model based on gabor filter and modified elman neural network",

author = "Y.H. Zhang and C.W.M. Yuen and Wong, {Wai Keung} and Kan, {Chi Wai}",

year = "2010",

language = "English",

pages = "69--74",

note = "International Conference on Image Analysis and Signal Processing [IASP] ; Conference date: 01-01-2010",

}

An intelligent knitted garment defect detection and classification model based on gabor filter and modified elman neural network. / Zhang, Y.H.; Yuen, C.W.M.; Wong, Wai Keung et al.
2010. 69-74 Paper presented at International Conference on Image Analysis and Signal Processing [IASP].

Research output: Unpublished conference presentation (presented paper, abstract, poster) › Conference presentation (not published in journal/proceeding/book) › Academic research › peer-review

TY - CONF

T1 - An intelligent knitted garment defect detection and classification model based on gabor filter and modified elman neural network

AU - Zhang, Y.H.

AU - Yuen, C.W.M.

AU - Wong, Wai Keung

AU - Kan, Chi Wai

PY - 2010

Y1 - 2010

M3 - Conference presentation (not published in journal/proceeding/book)

SP - 69

EP - 74

T2 - International Conference on Image Analysis and Signal Processing [IASP]

Y2 - 1 January 2010

ER -