Abstract
This paper presents a reliability-aware metadata allocation strategy called scatter-single-level cell (SLC) for multiple-level cell (MLC) NAND flash memory storage systems. In scatter-SLC, metadata is kept in least significant bit (LSB) pages and corresponding most significant bit (MSB) pages are bypassed. Without partitioning SLC and MLC blocks, scatter-SLC can eliminate the unbalanced lifetime between SLC and MLC blocks while achieving the similar error rate as the method to store metadata in SLC blocks. We implemented scatter-SLC on a real-hardware platform. The experiment results show that scatter-SLC can reduce uncorrectable page errors by 93.54% while incurring less than 1% time overhead on average compared with the previous work.
Original language | English |
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Article number | 7229298 |
Pages (from-to) | 691-694 |
Number of pages | 4 |
Journal | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
Volume | 35 |
Issue number | 4 |
DOIs | |
Publication status | Published - 1 Apr 2016 |
Keywords
- Metadata
- MLC
- NAND flash memory
- Reliability
- Shared page
ASJC Scopus subject areas
- Software
- Computer Graphics and Computer-Aided Design
- Electrical and Electronic Engineering