TY - GEN
T1 - ALN-based piezoelectric resonator for infrared sensing application
AU - Ang, Wan C.
AU - Kropelnicki, Piotr
AU - Campanella, Humberto
AU - Zhu, Yao
AU - Randles, Andrew B.
AU - Cai, Hong
AU - Gu, Yuandong A.
AU - Leong, Kam C.
AU - Tan, Chuan S.
PY - 2014/1
Y1 - 2014/1
N2 - This paper reports a highly sensitive aluminum nitride (AlN) based resonant uncooled infrared (IR) detector utilizing photo-sensitive and piezoelectric properties of polycrystalline AlN. The design, fabrication, and IR sensing characterization of the device are presented. Instead of resonant frequency shift, S21 magnitude shift was observed upon IR illumination under both vacuum and ambient measurements. Thus, photoresponse mechanism was proposed rather than thermal effect. An AlN resonator operating at 2.336 GHz with a quality factor (Q) of 830 exhibits an IR responsivity and detectivity of 166 kdB/W and 1.41 × 107 cm√Hz/W, respectively.
AB - This paper reports a highly sensitive aluminum nitride (AlN) based resonant uncooled infrared (IR) detector utilizing photo-sensitive and piezoelectric properties of polycrystalline AlN. The design, fabrication, and IR sensing characterization of the device are presented. Instead of resonant frequency shift, S21 magnitude shift was observed upon IR illumination under both vacuum and ambient measurements. Thus, photoresponse mechanism was proposed rather than thermal effect. An AlN resonator operating at 2.336 GHz with a quality factor (Q) of 830 exhibits an IR responsivity and detectivity of 166 kdB/W and 1.41 × 107 cm√Hz/W, respectively.
UR - http://www.scopus.com/inward/record.url?scp=84898935358&partnerID=8YFLogxK
U2 - 10.1109/MEMSYS.2014.6765734
DO - 10.1109/MEMSYS.2014.6765734
M3 - Conference article published in proceeding or book
AN - SCOPUS:84898935358
SN - 9781479935086
T3 - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
SP - 688
EP - 691
BT - MEMS 2014 - 27th IEEE International Conference on Micro Electro Mechanical Systems
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 27th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2014
Y2 - 26 January 2014 through 30 January 2014
ER -