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All-optical bit-error monitoring system using cascaded inverted wavelength converter and optical NOR gate

  • L. Y. Chan
  • , K. K. Qureshi
  • , Ping Kong Alexander Wai
  • , B. Moses
  • , L. F.K. Lui
  • , Hwa Yaw Tam
  • , M. S. Demokan

Research output: Journal article publicationJournal articleAcademic researchpeer-review

Abstract

A novel all-optical bit-error monitoring system is demonstrated by cascading two all-optical logic gates: an inverted wavelength converter and an optical NOR gate which are realized using injection-locked laser diodes operating at different thresholds. Real-time optical monitoring signal is generated which indicates the positions and duration of both bit and burst errors in 10-Gb/s nonreturn-to-zero signals.
Original languageEnglish
Pages (from-to)593-595
Number of pages3
JournalIEEE Photonics Technology Letters
Volume15
Issue number4
DOIs
Publication statusPublished - 1 Apr 2003

Keywords

  • Bit-error monitoring
  • Injection locking
  • Optical data processing
  • Optical logic gate

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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