All-optical bit-error monitoring system using cascaded inverted wavelength converter and optical NOR gate

L. Y. Chan, K. K. Qureshi, Ping Kong Alexander Wai, B. Moses, L. F.K. Lui, Hwa Yaw Tam, M. S. Demokan

Research output: Journal article publicationJournal articleAcademic researchpeer-review

67 Citations (Scopus)

Abstract

A novel all-optical bit-error monitoring system is demonstrated by cascading two all-optical logic gates: an inverted wavelength converter and an optical NOR gate which are realized using injection-locked laser diodes operating at different thresholds. Real-time optical monitoring signal is generated which indicates the positions and duration of both bit and burst errors in 10-Gb/s nonreturn-to-zero signals.
Original languageEnglish
Pages (from-to)593-595
Number of pages3
JournalIEEE Photonics Technology Letters
Volume15
Issue number4
DOIs
Publication statusPublished - 1 Apr 2003

Keywords

  • Bit-error monitoring
  • Injection locking
  • Optical data processing
  • Optical logic gate

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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