All-optical bit-error monitoring system using cascaded inverted wavelength converter and optical NOR gate

L. Y. Chan; K. K. Qureshi; Ping Kong Alexander Wai; B. Moses; L. F.K. Lui; Hwa Yaw Tam; M. S. Demokan

doi:10.1109/LPT.2003.809298

All-optical bit-error monitoring system using cascaded inverted wavelength converter and optical NOR gate

L. Y. Chan, K. K. Qureshi, Ping Kong Alexander Wai, B. Moses, L. F.K. Lui, Hwa Yaw Tam, M. S. Demokan

The Hong Kong Polytechnic University

Research output: Journal article publication › Journal article › Academic research › peer-review

73 Citations (Scopus)

Abstract

A novel all-optical bit-error monitoring system is demonstrated by cascading two all-optical logic gates: an inverted wavelength converter and an optical NOR gate which are realized using injection-locked laser diodes operating at different thresholds. Real-time optical monitoring signal is generated which indicates the positions and duration of both bit and burst errors in 10-Gb/s nonreturn-to-zero signals.

Original language	English
Pages (from-to)	593-595
Number of pages	3
Journal	IEEE Photonics Technology Letters
Volume	15
Issue number	4
DOIs	https://doi.org/10.1109/LPT.2003.809298
Publication status	Published - 1 Apr 2003

Keywords

Bit-error monitoring
Injection locking
Optical data processing
Optical logic gate

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

More information

10.1109/LPT.2003.809298

http://hdl.handle.net/10397/347

Cite this

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All-optical bit-error monitoring system using cascaded inverted wavelength converter and optical NOR gate

Abstract

Keywords

ASJC Scopus subject areas

More information

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