Advanced imaging of nanometer-scale recorded bits on super-resolution near-field optical disk

P.L. Yang, P.H. Chang, C.C. Hsu, W.C. Lin, T.S. Kao, C.W. Lin, Din-ping Tsai

Research output: Journal article publicationJournal articleAcademic researchpeer-review

1 Citation (Scopus)


An advanced imaging technique is demonstrated for fast, non-destructive and high resolution characterizations for nanometer-scale recorded bits on a super-resolution near-field optical disk (super-RENS), For the first time, an array of individual 100 nm recorded marks is imaged and studied by using the conductive-atomic force microscopy (C-AFM) method. Discussions also include comparisons of 300 nm, 200 nm and 100 nm recorded marks on both a super-RENS disk and a commercial DVD disk, and the image results are evidence of the high carrier-to-noise ratio (CNR) value on the super-RENS disk, even though the mark size has been shrunk to less than the diffraction limit.
Original languageEnglish
JournalJournal of the Korean Physical Society
Issue numberSUPPL. 1
Publication statusPublished - 1 Aug 2005


  • C-AFM
  • Near-field optics
  • Recording bit
  • Super-RENS
  • ZnO film

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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