Advance in the analysis models for characterizing multi-layered interdigital capacitors

K.W. Mak, Jianhua Hao

Research output: Journal article publicationJournal articleAcademic research

Abstract

The performances of multi-layered interdigital capacitors are commonly simulated by computer software. However, it is the time-consuming process. Besides simulations, the analytic models with closed form expressions provide convenient methods in particular usages, such as characterizing ferroelectric materials. This article briefly reviews the development in the expressions for analytic models. We provide an overview of partial capacitance technique and conformal mapping technique, which are used for formulating expressions. In addition, three common models used these techniques are presented. The differences of models and applications are also discussed.
Original languageEnglish
Pages (from-to)1-8
Number of pages8
JournalInternational journal of advanced applied physics research
Volume1
Issue number1
DOIs
Publication statusPublished - 2014

Keywords

  • Device modeling
  • Interdigital capacitors
  • Conformal mapping
  • Ferroelectric devices

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