Abstract
A physical based lumped element model is developed for lossy silicon Substrate considering both electric loss and eddy current loss induced by the substrate. Simplified ladder structure is used to accurate model the skin effect of the high conductivity silicon substrate. Good agreement with full wave solver is obtained for inductors on different resistivity silicon substrates.
Original language | English |
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Title of host publication | IEEE Radio Frequency Integrated Circuits Symposium, RFIC, Digest of Technical Papers |
Pages | 627-630 |
Number of pages | 4 |
Publication status | Published - 20 Sept 2004 |
Externally published | Yes |
Event | Digest of Papers - 2004 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Fort Worth, TX, United States Duration: 6 Jun 2004 → 8 Jun 2004 |
Conference
Conference | Digest of Papers - 2004 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium |
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Country/Territory | United States |
City | Fort Worth, TX |
Period | 6/06/04 → 8/06/04 |
Keywords
- Eddy currents
- Inductor model
- On-chip inductors
- Skin effect
- Substrate loss
ASJC Scopus subject areas
- General Engineering