A unified understanding on fully-depleted SOI NMOSFET hot-carrier degradation

  • Srinivasa R. Banna
  • , Philip Ching Ho Chan
  • , Mansun Chan
  • , Samuel K H Fung
  • , Ping K. Ko

Research output: Journal article publication › Journal article › Academic research › peer-review

9   Link opens in a new tab Citations (Scopus)

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Engineering