A scanning differential optical system for simultaneous phase and amplitude measurement

Keyphrases

• Phase Measurement 100%
• Optical System 100%
• Amplitude Measurement 100%
• Phase Information 66%
• Amplitude Information 66%
• First-order 33%
• Crystalline Structure 33%
• Refractive Index Difference 33%
• Object Surface 33%
• Film Thickness 33%
• Reflectivity 33%
• Two-beam 33%
• Theoretical Sensitivity 33%
• High Sensitivity 33%
• Amplitude Frequency 33%
• Surface Profilometry 33%
• Amplitude Modulation 33%
• Optical Frequencies 33%
• Close Proximity 33%
• Surface Measurement 33%
• Amplitude Response 33%
• Refractive Index Measurement 33%
• Low Contrast 33%
• Acousto-optic Modulator 33%
• Amplitude Modulated 33%
• Biological Specimens 33%
• Phase Quadrature 33%
• Layered Model 33%
• Bragg Cell 33%
• Thickness Metrology 33%
• Sampling numbers 33%

Engineering

• Phase Information 100%
• Optical Systems 100%
• Potential Application 50%
• Close Proximity 50%
• Optical Frequency 50%
• Practical Problem 50%
• Bragg Cell 50%
• Sample Surface 50%
• Reflected Light 50%
• Incoming Light 50%
• Optic Modulator 50%
• Optical Scanning System 50%
• Refractive Index 50%
• Crystal Structure 50%
• Reflectance 50%
• Refractivity 50%
• Amplitude Modulation 50%

Physics

• Amplitude Modulation 100%
• Film Thickness 100%
• Acousto-Optics 100%
• Refractivity 100%
• Reflectance 100%
• Crystal Structure 100%