Keyphrases
Phase Measurement
100%
Optical System
100%
Amplitude Measurement
100%
Phase Information
66%
Amplitude Information
66%
First-order
33%
Crystalline Structure
33%
Refractive Index Difference
33%
Object Surface
33%
Film Thickness
33%
Reflectivity
33%
Two-beam
33%
Theoretical Sensitivity
33%
High Sensitivity
33%
Amplitude Frequency
33%
Surface Profilometry
33%
Amplitude Modulation
33%
Optical Frequencies
33%
Close Proximity
33%
Surface Measurement
33%
Amplitude Response
33%
Refractive Index Measurement
33%
Low Contrast
33%
Acousto-optic Modulator
33%
Amplitude Modulated
33%
Biological Specimens
33%
Phase Quadrature
33%
Layered Model
33%
Bragg Cell
33%
Thickness Metrology
33%
Sampling numbers
33%
Engineering
Phase Information
100%
Optical Systems
100%
Potential Application
50%
Close Proximity
50%
Optical Frequency
50%
Practical Problem
50%
Bragg Cell
50%
Sample Surface
50%
Reflected Light
50%
Incoming Light
50%
Optic Modulator
50%
Optical Scanning System
50%
Refractive Index
50%
Crystal Structure
50%
Reflectance
50%
Refractivity
50%
Amplitude Modulation
50%
Physics
Amplitude Modulation
100%
Film Thickness
100%
Acousto-Optics
100%
Refractivity
100%
Reflectance
100%
Crystal Structure
100%