A reliability model for multi-state networks with link-capacities of production line

Y. Liu; W.H. Ip; Kai Leung Yung; Y. Zhang; D. Wang

A reliability model for multi-state networks with link-capacities of production line

Y. Liu, W.H. Ip, Kai Leung Yung, Y. Zhang, D. Wang

Research output: Unpublished conference presentation (presented paper, abstract, poster) › Conference presentation (not published in journal/proceeding/book) › Academic research › peer-review

Original language	English
Pages	80-84
Number of pages	5
Publication status	Published - 2003
Event	International IEE Conference on the Business of Electronic Product Reliability and Liability - Duration: 1 Jan 2003 → …

Conference

Conference	International IEE Conference on the Business of Electronic Product Reliability and Liability
Period	1/01/03 → …

Cite this

@conference{7574e9b7df9b4f5284ae857b004775ab,

title = "A reliability model for multi-state networks with link-capacities of production line",

author = "Y. Liu and W.H. Ip and Yung, {Kai Leung} and Y. Zhang and D. Wang",

year = "2003",

language = "English",

pages = "80--84",

note = "International IEE Conference on the Business of Electronic Product Reliability and Liability ; Conference date: 01-01-2003",

}

A reliability model for multi-state networks with link-capacities of production line. / Liu, Y.; Ip, W.H.; Yung, Kai Leung et al.

2003. 80-84 Paper presented at International IEE Conference on the Business of Electronic Product Reliability and Liability.

Research output: Unpublished conference presentation (presented paper, abstract, poster) › Conference presentation (not published in journal/proceeding/book) › Academic research › peer-review

TY - CONF

T1 - A reliability model for multi-state networks with link-capacities of production line

AU - Liu, Y.

AU - Ip, W.H.

AU - Yung, Kai Leung

AU - Zhang, Y.

AU - Wang, D.

PY - 2003

Y1 - 2003

M3 - Conference presentation (not published in journal/proceeding/book)

SP - 80

EP - 84

T2 - International IEE Conference on the Business of Electronic Product Reliability and Liability

Y2 - 1 January 2003

ER -