Abstract
This study proposes a novel approach for image super-resolution (SR) that combines deep learning algorithms, adaptive multi-path structures, and classification models. The goal is to enhance industrial product details, improve visual quality, and achieve better quantitative metrics such as PSNR and SSIM. The proposed multi-path super-resolution algorithm utilizes a big-size convolution kernel and residual network to extract features at different scales, enabling the capture and enhancement of fine details in low-resolution images. Two different loss functions are incorporated to improve the visual quality and fidelity of the SR images. Furthermore, the integration of a super-resolution model with a ResNet-18 classification model enhances image clarity, detail retention, and overall performance. The experimental results demonstrate that our proposed super resolution (SR) algorithm outperforms several typical methods. Additionally, incorporating the ResNet-18 classification model
improves the performance of the model on the NEU-CLS dataset, achieving higher accuracy, recall, precision, and F1-score compared to the original dataset.
improves the performance of the model on the NEU-CLS dataset, achieving higher accuracy, recall, precision, and F1-score compared to the original dataset.
Original language | English |
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Title of host publication | 2023 IECON – 49th Annual Conference of the IEEE Industrial Electronics Society |
Place of Publication | Singapore |
Publisher | IEEE Industrial Electronics Society |
Pages | e-copy |
Number of pages | 6 |
Publication status | Published - Oct 2023 |
Event | 49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023 - Singapore, Singapore Duration: 16 Oct 2023 → 19 Oct 2023 |
Conference
Conference | 49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023 |
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Country/Territory | Singapore |
City | Singapore |
Period | 16/10/23 → 19/10/23 |
Keywords
- image super-resolution
- deep learning algorithms
- multi-path super-resolution algorithm
- ResNet