A line drawings degradation model for performance characterization

Jian Zhai, Liu Wenyin, Dov Dori, Qing Li

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

13 Citations (Scopus)

Abstract

Line detection algorithms constitute the basis for technical document analysis and recognition. The performance of these algorithms decreases as the quality of the documents degrades. To test the robustness of line detection algorithms under noisy circumstance, we propose a document degradation mode, which simulates noise types that drawings may undergo during their production, storage, photocopying, or scanning. Using our model, a series of document images at various noise levels and types can be generated for testing the performance of line detection algorithms. To illustrate that our model is consistent with real world noise types, we validated the method by applying it to three line recognition algorithms.

Original languageEnglish
Title of host publicationProceedings - 7th International Conference on Document Analysis and Recognition, ICDAR 2003
PublisherIEEE Computer Society
Pages1020-1024
Number of pages5
ISBN (Electronic)0769519601
DOIs
Publication statusPublished - 1 Jan 2003
Externally publishedYes
Event7th International Conference on Document Analysis and Recognition, ICDAR 2003 - Edinburgh, United Kingdom
Duration: 3 Aug 20036 Aug 2003

Publication series

NameProceedings of the International Conference on Document Analysis and Recognition, ICDAR
Volume2003-January
ISSN (Print)1520-5363

Conference

Conference7th International Conference on Document Analysis and Recognition, ICDAR 2003
CountryUnited Kingdom
CityEdinburgh
Period3/08/036/08/03

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition

Cite this