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A Differentiable Two-stage Alignment Scheme for Burst Image Reconstruction with Large Shift

  • Shi Guo
  • , Xi Yang
  • , Jianqi Ma
  • , Gaofeng Ren
  • , Lei Zhang

Research output: Chapter in book / Conference proceedingConference article published in proceeding or bookAcademic researchpeer-review

Abstract

Denoising and demosaicking are two essential steps to reconstruct a clean full-color image from the raw data. Recently, joint denoising and demosaicking (JDD) for burst images, namely JDD-B, has attracted much attention by using multiple raw images captured in a short time to reconstruct a single high-quality image. One key challenge of JDD-B lies in the robust alignment of image frames. State-of-the-art alignment methods in feature domain cannot effectively utilize the temporal information of burst images, where large shifts commonly exist due to camera and object motion. In addition, the higher resolution (e.g., 4K) of modern imaging devices results in larger displacement between frames. To address these challenges, we design a differentiable two-stage alignment scheme sequentially in patch and pixel level for effective JDD-B. The input burst images are firstly aligned in the patch level by using a differentiable progressive block matching method, which can estimate the offset between distant frames with small computational cost. Then we perform implicit pixel-wise alignment in full-resolution feature domain to refine the alignment results. The two stages are jointly trained in an end-to-end manner. Extensive experiments demonstrate the significant improvement of our method over existing JDD-B methods. Codes are available at https://github.com/GuoShi28/2StageAlign.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
PublisherIEEE Computer Society
Pages17451-17460
Number of pages10
ISBN (Electronic)9781665469463
DOIs
Publication statusPublished - Jun 2022
Event2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022 - New Orleans, United States
Duration: 19 Jun 202224 Jun 2022

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Volume2022-June
ISSN (Print)1063-6919

Conference

Conference2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
Country/TerritoryUnited States
CityNew Orleans
Period19/06/2224/06/22

Keywords

  • Computational photography
  • Low-level vision

ASJC Scopus subject areas

  • Software
  • Computer Vision and Pattern Recognition

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