Abstract
To consider the nonlinear and 2-D characteristics of the carriers in the draft region of a planar-gate insulated-gate bipolar transistor, which are not properly modeled in the existing physics-based IGBT models, a 2-D ambipolar diffusion equation model is proposed and solved using the finite-element method. Moreover, a numerically iterative procedure is introduced to simply and efficiently solve the 2-D nonlinear finite-element equations. The numerical results of the transient performances obtained using the proposed model and solution methodology show a good agreement with those of the experiment ones, showing the high accuracy and feasibility of the proposed model and method.
| Original language | English |
|---|---|
| Article number | 7001304 |
| Journal | IEEE Transactions on Magnetics |
| Volume | 54 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 1 Mar 2018 |
Keywords
- Ambipolar diffusion equation (ADE)
- insulated-gate bipolar transistor (IGBT)
- transient behavior
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
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