10.17 - On-machine freeform optics measurement for precision manufacturing

Shixiang Wang; Lingbao Kong; Chifai Cheung

doi:10.1016/B978-0-323-96020-5.00247-8

10.17 - On-machine freeform optics measurement for precision manufacturing

Shixiang Wang
, Lingbao Kong
, Chifai Cheung

Research output: Chapter in book / Conference proceeding › Chapter in an edited book (as author) › Academic research › peer-review

1 Citation (Scopus)

Abstract

With the rapid increase of the complexity of optical freeform surfaces, on-machine measurement has become a critical factor in manufacturing high-performance surfaces. In this article, advanced on-machine measurement systems and error evaluation methods for freeform surfaces are introduced. Probe-based scanning methods and full-aperture measurement techniques along with their corresponding sampling strategies are then presented. Subsequently, the algorithms for surface registration, error evaluation, multi-source data fusion and traceability methods are introduced. Furthermore, some of the advantages and disadvantages of the existing methods are analyzed and the future trends in on-machine measurement are discussed.

Original language	English
Title of host publication	Comprehensive Materials Processing
Subtitle of host publication	Volume 1-13, Second edition
Publisher	Elsevier
Pages	399-417
Number of pages	19
Volume	10
ISBN (Electronic)	9780323960212
ISBN (Print)	9780323960205
DOIs	https://doi.org/10.1016/B978-0-323-96020-5.00247-8
Publication status	Published - Jun 2024

Keywords

Evaluation parameters
Form characterization
On-machine measurement
Optical freeform

ASJC Scopus subject areas

General Engineering

More information

10.1016/B978-0-323-96020-5.00247-8

Cite this

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abstract = "With the rapid increase of the complexity of optical freeform surfaces, on-machine measurement has become a critical factor in manufacturing high-performance surfaces. In this article, advanced on-machine measurement systems and error evaluation methods for freeform surfaces are introduced. Probe-based scanning methods and full-aperture measurement techniques along with their corresponding sampling strategies are then presented. Subsequently, the algorithms for surface registration, error evaluation, multi-source data fusion and traceability methods are introduced. Furthermore, some of the advantages and disadvantages of the existing methods are analyzed and the future trends in on-machine measurement are discussed.",

keywords = "Evaluation parameters, Form characterization, On-machine measurement, Optical freeform",

author = "Shixiang Wang and Lingbao Kong and Chifai Cheung",

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T1 - 10.17 - On-machine freeform optics measurement for precision manufacturing

AU - Wang, Shixiang

AU - Kong, Lingbao

AU - Cheung, Chifai

PY - 2024/6

Y1 - 2024/6

N2 - With the rapid increase of the complexity of optical freeform surfaces, on-machine measurement has become a critical factor in manufacturing high-performance surfaces. In this article, advanced on-machine measurement systems and error evaluation methods for freeform surfaces are introduced. Probe-based scanning methods and full-aperture measurement techniques along with their corresponding sampling strategies are then presented. Subsequently, the algorithms for surface registration, error evaluation, multi-source data fusion and traceability methods are introduced. Furthermore, some of the advantages and disadvantages of the existing methods are analyzed and the future trends in on-machine measurement are discussed.

AB - With the rapid increase of the complexity of optical freeform surfaces, on-machine measurement has become a critical factor in manufacturing high-performance surfaces. In this article, advanced on-machine measurement systems and error evaluation methods for freeform surfaces are introduced. Probe-based scanning methods and full-aperture measurement techniques along with their corresponding sampling strategies are then presented. Subsequently, the algorithms for surface registration, error evaluation, multi-source data fusion and traceability methods are introduced. Furthermore, some of the advantages and disadvantages of the existing methods are analyzed and the future trends in on-machine measurement are discussed.

KW - Evaluation parameters

KW - Form characterization

KW - On-machine measurement

KW - Optical freeform

UR - https://www.scopus.com/pages/publications/85214488043

U2 - 10.1016/B978-0-323-96020-5.00247-8

DO - 10.1016/B978-0-323-96020-5.00247-8

M3 - Chapter in an edited book (as author)

AN - SCOPUS:85214488043

SN - 9780323960205

VL - 10

SP - 399

EP - 417

BT - Comprehensive Materials Processing

PB - Elsevier

ER -

10.17 - On-machine freeform optics measurement for precision manufacturing

Abstract

Keywords

ASJC Scopus subject areas

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