The 2025 IEEE Far East NDT New Technology & Application Forum (FENDT) was held from 23 to 26 June 2025 in Wuhan, China. Mr Zhang presented his research titled “Ultrafast Photoacoustic Characterization of Unsupported Ultrathin Films”, which stood out among other participants from the Far east region. Technically sponsored by IEEE, FENDT aims to strengthen academic collaboration and advance innovation in non-destructive testing (NDT). Since its inception in Nanjing in 2004, the forum has grown into China’s premier NDT event, fostering breakthroughs in the field.
Awarded date
26 Jun 2025
Degree of recognition
International
Granting Organisations
Organizing Committee of IEEE Far East NDT New Technology & Application Forum