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Jiyan Dai

 https://orcid.org/0000-0002-7720-8032
Calculated based on number of publications stored in Pure and citations from Scopus
1993 …2023

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  • 2018

    Flexible Solid-state Supercapacitors Using Paper-based Electrodes for Energy Storage

    Yu, K., Tang, W. M. & Dai, J. Y., 9 Oct 2018, 2018 IEEE International Conference on Electron Devices and Solid State Circuits, EDSSC 2018. Institute of Electrical and Electronics Engineers Inc., 8487145. (2018 IEEE International Conference on Electron Devices and Solid State Circuits, EDSSC 2018).

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

    3 Citations (Scopus)
  • 2017

    A study on MnCo2S4@NiCo(OH)2 core-shell nanocomposite for high-performance solid-state supercapacitor applications

    Yu, K., Tang, W. M. & Dai, J. Y., 1 Dec 2017, EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits. Institute of Electrical and Electronics Engineers Inc., p. 1-2 2 p. (EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits; vol. 2017-January).

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

    1 Citation (Scopus)
  • 2016

    An ultrawide bandwidth high frequency phased-array ultrasound transducer fabricated using the PMN-0.3PT single crystal

    Wong, C. M., Chen, Y., Luo, H., Dai, J., Lam, K. H. & Chan, H. L. W., 1 Nov 2016, 2016 IEEE International Ultrasonics Symposium, IUS 2016. IEEE Computer Society, Vol. 2016-November. 7728580

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

    4 Citations (Scopus)

  • Thickness-dependent bipolar resistive switching behaviors of NiOxfilms

    Zhu, H. X., Huo, J. Q., Qiu, X. Y., Zhang, Y. Y., Wang, R. X., Chen, Y., Wong, C. M., Yau, H. M. & Dai, J., 1 Jan 2016, Materials and Technologies for Energy Supply and Environmental Engineering. Trans Tech Publications Ltd, p. 131-136 6 p. (Materials Science Forum; vol. 847).

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

    Open Access
    6 Citations (Scopus)
  • 2015

    Acoustic characterization of nano gas vesicles

    Yang, Y., Qiu, Z., Liu, C., Huang, Y., Sun, L. & Dai, J., 13 Nov 2015, 2015 IEEE International Ultrasonics Symposium, IUS 2015. IEEE, 7329446

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

    2 Citations (Scopus)
  • 2014

    Devolopment of focused IVUS transducer using PMN-PT single crystal: Single-element focused IVUS transducer

    Guo, F., Liu, C., Yang, Y., Sun, L., Yang, B., Chen, Y. & Dai, J., 1 Jan 2014, IEEE International Ultrasonics Symposium, IUS. IEEE Computer Society, p. 97-100 4 p. 6932167

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

    Open Access
    1 Citation (Scopus)
  • 2013

    A novel high-frequency endoscopic ultrasound system for colorectal cancer diagnosis

    Liu, C., Yanyan, Sun, L., Chen, Y., Dai, J. & Qiu, W., 1 Dec 2013, 2013 IEEE International Ultrasonics Symposium, IUS 2013. p. 2045-2048 4 p. 6724836

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

    3 Citations (Scopus)
  • 2012

    An open system for intravascular ultrasound imaging

    Qiu, W., Yu, Y., Chen, Y., Li, X., Liu, C., Cheng, W. F., Zhou, Q., Shung, K. K., Dai, J., Zheng, H. & Sun, L., 1 Dec 2012, 2012 IEEE International Ultrasonics Symposium, IUS 2012. 6561922

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

    1 Citation (Scopus)
  • 2010

    Endoscopic ultrasound radial arrays fabricated with high- performancepiezocrystal and piezocomposite

    Zhou, D., Dai, J., Chan, H. L. W., Wu, J., Cai, H., Luo, H., Lau, S. T., Hu, C. H., Zhou, Q. & Shung, K. K., 1 Dec 2010, 2010 IEEE International Ultrasonics Symposium, IUS 2010. p. 2068-2071 4 p. 5935963

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

    5 Citations (Scopus)

  • Growth and characterizations of CoFe2O4-ZnO nanocomposite thin films

    Li, D. F., Zhang, J. X. & Dai, J., 5 May 2010, INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings. p. 722-723 2 p. 5424572

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

  • 2006

    Synthesis of In2O3 nanowires enhanced by anodic alumina membrane

    Lai, C. W., Zhang, X. Y., Ong, H. C., Dai, J. & Chan, H. L. W., 2006, International Journal of Nanoscience. 2018-05-04 ed. Vol. 5. p. 479-485 7 p.

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

  • 2002

    Front-end processing defect localization by contact-level passive voltage contrast technique and root cause analysis

    Song, Z. G., Dai, J., Ansari, S., Oh, C. K. & Redkar, S., 1 Jan 2002, Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2002. IEEE, Vol. 2002-January. p. 97-100 4 p. 1025619

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

    21 Citations (Scopus)
  • 2001

    Application of contact-level ion-beam induced passive voltage contrast in failure analysis of static random access memory

    Song, Z. G., Qian, G., Dai, J., Guo, Z. R., Loh, S. K., Teh, C. S. & Redkar, S., 1 Jan 2001, Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA. p. 103-106 4 p.

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

    18 Citations (Scopus)

  • Failure mechanism study for high resistance contact in CMOS devices

    Dai, J., Ansari, S., Tay, C. L., Tee, S. F., Er, E. & Redkar, S., 1 Jan 2001, Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA. p. 130-133 4 p.

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

    5 Citations (Scopus)

  • High resistance via induced by marginal barrier metal step coverage and F diffusion

    Dai, J., Loh, S. K., Tee, S. F., Tay, C. L., Ansari, S., Er, E. & Redkar, S., 1 Jan 2001, Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA. p. 183-186 4 p.

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

    12 Citations (Scopus)

  • Poly-residue-induced contact failures in 0.18um technology

    Teh, C. S., Song, Z. G., Dai, J., Guo, Z. R. & Redkar, S., 1 Jan 2001, Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA. p. 117-120 4 p.

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

    5 Citations (Scopus)

  • TEM Examination of a Specified Site Identified by X-SEM in Microelectronics Failure Analysis

    Dai, J., Tee, S. F., Tay, C. L., Ansari, S., Er, E. & Redkar, S., 1 Dec 2001, Conference Proceedings from the International Symposium for Testing and Failure Analysis. p. 121-123 3 p.

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review

    1 Citation (Scopus)

  • Yield-Limiting Defect Analysis in 0.15 μm Process Development

    Song, Z. G., Qian, G., Dai, J., Ansari, S., Oh, C. K. & Redkar, S., 1 Dec 2001, Conference Proceedings from the International Symposium for Testing and Failure Analysis. p. 431-435 5 p.

    Research output: Chapter in book / Conference proceeding › Conference article published in proceeding or book › Academic research › peer-review